Author:
Meng Xiankai,Tan Qingping,Shao Zeming,Zhang Nan,Xu Jianjun,Zhang Haoyu
Reference9 articles.
1. Hardware fault injection[M]//Soft Errors in Modern Electronic Systems;Entrena,2011
2. Formal verification of signature-monitoring mechanisms by model checking[J].;Tan;Computer Science and Information Systems,2012
3. Shafique M, Rehman S, Aceituno P V, et al. Exploiting program-level masking and error propagation for constrained reliability optimization[C]//Proceedings of the 50th Annual Design Automation Conference. ACM, 2013: 17.
4. "Test Facilities for SEE and Dose Testing”, Radiation Effects on Embedded Systems;Duzellier,2007
5. "In-Flight Anomalies on Electronic Devices”, Radiation Effects on Embedded Systems;Ecoffet,2007
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