Embedded Transient Shock Signal Storage Test Technique under High Overload-Reference-Cited by-同舟云学术

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Embedded Transient Shock Signal Storage Test Technique under High Overload

Published:2015 Issue: Volume:52 Page:1166-1170
ISSN:1877-0509
Container-title:Procedia Computer Science
language:en
Short-container-title:Procedia Computer Science

Author:

Yi Zhang,Rong Zhang,Jikun Zhou,Ying Chen

Publisher

Elsevier BV

Subject

General Engineering

Reference8 articles.

1. YU Jun, WANG Bo, JIAO Xinquan, QIN Li.Platform building of anti-high overload capacity data storage test system. Computer Measurement & Control 2009: 17(12): 2410-2412.

2. CHEN Kexun, PEI Dongxing, JING Hong.Design of storage testing system based on DSP. Journal of Data Acquisition & Processing 2009:24: 302-304.

3. WEN Feng, QIAO Jianzhong, LI Yan.Study on anti over-loaded technology in high over-loaded storage testing.Transducer and Microsystem Technologies 2009:28(9):31-34.

4. ZHU Shiyong, ZU Jing, FAN Jinbiao.Missile-borne storage measurement and test instrument of acceleration based on CPLD. Journal of Detection & Control 2009:31(1):43-46.

5. HAN Xueping, RUI Xiaoting, YANG Fufeng.Design and simulation on projectile-borne storage testing system based on embedded system. Journal of System Simulation 2009:21(1):84-87.

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1. A measurement method of in-bore projectile motion acceleration based on bottom pressure correction;Measurement Science and Technology;2024-05-03

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