Breadmaking quality and yield response to the green leaf area duration caused by fluxapyroxad under three nitrogen rates in wheat affected with tan spot
Author:
Funder
ANPCyT
CONICET
UNLP
Publisher
Elsevier BV
Subject
Agronomy and Crop Science
Reference58 articles.
1. Foliar application of isopyrazam and epoxiconazole improves photosystem II efficiency, biomass and yield in winter wheat;Ajigboye;Pestic. Biochem. Physiol.,2014
2. Population race structure of Pyrenophora tritici-repentis prevalent on wheat and noncereal grasses in the Great Plains;Ali;Plant Dis.,2003
3. Official Methods of Analysis;AOAC,1970
4. Sensors and imaging techniques for the assessment of the delay of wheat senescence induced by fungicides;Berdugo;Funct. Plant Biol.,2012
5. Effect of fungicide and foliar fertilizer application to winter wheat at anthesis on flag leaf senescence, grain yield, flour bread-making quality and DON contamination;Blandino;Eur. J. Agron.,2009
Cited by 23 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. How septoria leaf blotch affects nitrogen dynamics, grain yield and protein concentration in wheat;Cereal Research Communications;2024-08-08
2. Nitrogen and Silicon Contribute to Wheat Defense’s to Pyrenophora tritici-repentis, but in an Independent Manner;Plants;2024-05-21
3. Sensitive voltammetric approach for selective determination of a new generation fungicides mefentrifluconazole and fluxapyroxad;Microchemical Journal;2024-04
4. Grain yield and quality losses caused by tan spot in wheat cultivars in Australia;PhytoFrontiers™;2023-10-19
5. Role of Mineral Nitrogen Nutrition in Fungal Plant Diseases of Cereal Crops;Critical Reviews in Plant Sciences;2023-04-07
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3