Author:
Lee Wen-Chuan,Wu Jong-Wuu,Hong Ching-Wen
Subject
Applied Mathematics,Computational Mathematics
Reference23 articles.
1. Process capability analysis for non-normal relay test data;Pan;Microelectronics and Reliability,1997
2. Introduction to Statistical Quality Control;Montgomery,1985
3. Process capability indices;Kane;Journal of Quality Technology,1986
4. Statistical testing for assessing the performance of lifetime index of electronic components with exponential distribution;Tong;International Journal of Quality & Reliability Management,2002
5. Assessing the lifetime performance of electronic components by confidence interval;Chen;Journal of the Chinese Institute of Industrial Engineers,2002
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