Application of automated crystallography for transmission electron microscopy in the study of grain-boundary segregation
Author:
Publisher
Elsevier BV
Subject
Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science
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1. Automated Crystal Orientation Mapping by Precession Electron Diffraction-Assisted Four-Dimensional Scanning Transmission Electron Microscopy Using a Scintillator-Based CMOS Detector;Microscopy and Microanalysis;2021-08-18
2. Measuring grain boundary segregation using Wavelength Dispersive X-ray Spectroscopy: Further developments;Surface Science;2011-04
3. Advance in Orientation Microscopy: Quantitative Analysis of Nanocrystalline Structures;ACS Nano;2011-03-11
4. Nanostructure characterisation using electron-beam techniques;Nanostructure Control of Materials;2006
5. The relationship between grain-boundary structure and segregation in a rapidly solidified Fe-P alloy;Philosophical Magazine;2005-06-21
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