Anisotropic electric properties of Copper-(II)-Phthalocyanine thin films characterized by a near-field microwave microscope-Reference-Cited by-同舟云学术

Anisotropic electric properties of Copper-(II)-Phthalocyanine thin films characterized by a near-field microwave microscope

Published:2011-03 Issue:2 Volume:11 Page:166-170
ISSN:1567-1739
Container-title:Current Applied Physics
language:en
Short-container-title:Current Applied Physics

Author:

Babajanyan Arsen,Enkhtur Lkhamsuren,Khishigbadrakh Balt-Erdene,Melikyan Harutyun,Yoon Youngwoon,Kim Songhui,Lee Hanju,Kim Taedong,Lee Kiejin,Friedman Barry

Publisher

Elsevier BV

Subject

General Physics and Astronomy,General Materials Science

Reference28 articles.

1. Estimation of the Minority Carrier Diffusion Length by Near-Field Photocurrent Measurement of p-n Junction in Silicon using Multiwavelength Excitation

2. Photocurrent diffusion length in disordered GaN

3. Diffusion length measurements in p-HgCdTe using laser beam induced current

4. Intrinsic transport and contact resistance effect in C60 field-effect transistors

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