Annealing temperature dependent on structural, optical and electrical properties of indium oxide thin films deposited by electron beam evaporation method-Reference-Cited by-同舟云学术

Annealing temperature dependent on structural, optical and electrical properties of indium oxide thin films deposited by electron beam evaporation method

Published:2010-05 Issue:3 Volume:10 Page:880-885
ISSN:1567-1739
Container-title:Current Applied Physics
language:en
Short-container-title:Current Applied Physics

Author:

Senthilkumar V.,Vickraman P.

Publisher

Elsevier BV

Subject

General Physics and Astronomy,General Materials Science

Reference28 articles.

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5. Optical properties of indium oxide;Weiher;J. Appl. Phys.,1966

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