Er 0.4 Bi 1.6 O 3 thin films in situ crystallized at low temperature onto the Gd 0.1 Ce 0.9 O 1.95 bulk electrolytes via Facing-Target Sputtering-Reference-Cited by-同舟云学术

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Er 0.4 Bi 1.6 O 3 thin films in situ crystallized at low temperature onto the Gd 0.1 Ce 0.9 O 1.95 bulk electrolytes via Facing-Target Sputtering

Published:2017-05 Issue:5 Volume:17 Page:751-755
ISSN:1567-1739
Container-title:Current Applied Physics
language:en
Short-container-title:Current Applied Physics

Author:

Jeung Ji-Na,Eom Ji-Ho,Park Byeong-Ju,Kim Sun-Dong,Yoon Soon-Gil

Funder

National Research Foundation of Korea

Korea government (MSIP)

Publisher

Elsevier BV

Subject

General Physics and Astronomy,General Materials Science

Reference22 articles.

1. Solid state ionics: roots, status and future prospects;Knauth;J. Am. Ceram. Soc.,2002

2. Kinetic parameters influencing the performance of IT-SOFC composite electrodes;Steele;Solid State Ionics,2000

3. Physical, chemical and electrochemical properties of pure and doped ceria;Mogensen;Solid State Ionics,2000

4. Characterization of (CeO2)0.8(GdO1.5)0.2 synthesized using various techniques;Torrens;Solid State Ionics,1998

5. Electrochemical characterization of thin films for a micro-solid oxide fuel cell;Hertz;J. Electroceram,2004

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