Z-scan analysis of elliptical Gaussian beams in Kerr media through the variational method: Toward integrative analytic solutions of Z-scan-Reference-Cited by-同舟云学术

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Z-scan analysis of elliptical Gaussian beams in Kerr media through the variational method: Toward integrative analytic solutions of Z-scan

Published:2017-02 Issue:2 Volume:17 Page:290-297
ISSN:1567-1739
Container-title:Current Applied Physics
language:en
Short-container-title:Current Applied Physics

Author:

Lee Sang Jo^ORCID,Kim Geun-Hyeong^ORCID,Mun Young Hee,Sohn Chang Won,Hong Kwang Hee,Kim Hee Dae^ORCID,Kim Jong Su,Kwak Chong Hoon

Funder

Yeungnam University

Publisher

Elsevier BV

Subject

General Physics and Astronomy,General Materials Science

Reference17 articles.

1. High-sensitivity single-beam n2 measurements;Sheik-Bahae;Opt. Lett.,1989

2. Sensitive measurement of optical nonlinearities using a single beam;Sheik-Bahae;IEEE J. Quantum Electron.,1990

3. Nonlinear refraction and optical limiting in thick media;Sheik-Bahae;Opt. Eng.,1991

4. Analysis of spatial scanning with thick optically nonlinear media;Hermann;J. Opt. Soc. Am. B,1993

5. Z-scan studies in the thin- and the thick-sample limits;Chapple;J. Opt. Soc. Am. B,1994

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