Spectroscopic ellipsometry investigation on the excimer laser annealed indium thin oxide sol–gel films-Reference-Cited by-同舟云学术

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Spectroscopic ellipsometry investigation on the excimer laser annealed indium thin oxide sol–gel films

Published:2016-02 Issue:2 Volume:16 Page:145-149
ISSN:1567-1739
Container-title:Current Applied Physics
language:en
Short-container-title:Current Applied Physics

Author:

Noh Miru,Seo Ilwan,Park Junghyun,Chung J.-S.,Lee Y.S.,Kim Hyuk Jin,Chang Young Jun,Park J.-H.,Kang Min Gyu,Kang Chong Yun

Funder

Korea government (MOE)

MSIP

Publisher

Elsevier BV

Subject

General Physics and Astronomy,General Materials Science

Reference27 articles.

1. Transparent Electronics;Facchetti,2010

2. Transparent Electronics

3. Transparent conducting oxide semiconductors for transparent electrodes

4. Is indium tin oxide a suitable electrode in organic solar cells? Photovoltaic properties of interfaces in organic p∕n junction photodiodes

5. Tin doped indium oxide thin films: Electrical properties

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1. Physicochemical Analysis of Nanoscale Metal Oxide Thin Film Precursors via Infrared Spectroscopic Ellipsometry;The Journal of Physical Chemistry C;2023-08-07

2. Phthalocyanine and Porphyrin Films on Glass Substrates—Processing, Properties, and Applications;Advances in Glass Research;2023

3. Photo-engineered optoelectronic properties of indium tin oxide via reactive laser annealing;Scientific Reports;2022-09-02

4. Application of Laser Treatment in MOS-TFT Active Layer Prepared by Solution Method;Micromachines;2021-11-30

5. Optical, microstructural and vibrational properties of sol–gel ITO films;Optical Materials;2021-04

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