Rethinking precision of pseudo label: Test-time adaptation via complementary learning-Reference-Cited by-同舟云学术

Rethinking precision of pseudo label: Test-time adaptation via complementary learning

Published:2024-01 Issue: Volume:177 Page:96-102
ISSN:0167-8655
Container-title:Pattern Recognition Letters
language:en
Short-container-title:Pattern Recognition Letters

Author:

Zeng Longbin^ORCID,Han Jiayi^ORCID,Du Liang^ORCID,Ding Weiyang^ORCID

Funder

National Key Research and Development Program of China

Science and Technology Commission of Shanghai Municipality

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software

Reference25 articles.

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4. Test-time adaptation to distribution shift by confidence maximization and input transformation;Mummadi,2021

5. X. Yu, T. Liu, M. Gong, D. Tao, Learning with biased complementary labels, in: Proceedings of the European Conference on Computer Vision (ECCV), 2018, pp. 68–83.

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