Image description using joint distribution of filter bank responses-Reference-Cited by-同舟云学术

Image description using joint distribution of filter bank responses

Published:2009-03 Issue:4 Volume:30 Page:368-376
ISSN:0167-8655
Container-title:Pattern Recognition Letters
language:en
Short-container-title:Pattern Recognition Letters

Author:

Ahonen Timo,Pietikäinen Matti

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software

Reference30 articles.

1. Ahonen, T., Pietikäinen, M., 2008. A framework for analyzing texture descriptors. In: Third Internat. Conf. on Computer Vision Theory and Applications (VISAPP 2008), pp. 1:507–1:512.

2. Face description with local binary patterns: Application to face recognition;Ahonen;IEEE Trans. Pattern Anal. Machine Intell.,2006

3. Caputo, B., Hayman, E., Mallikarjuna, P., 2005. Class-specific material categorisation. In: Proc. 10th IEEE Internat. Conf. on Computer Vision (ICCV 05), vol. 2, pp. 1597–1604.

4. Searching in metric spaces;Chávez;ACM Comput. Surv.,2001

5. Designing Gabor filters for optimal texture separability;Clausi;Pattern Recognition,2000

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