Author:
Bhandarkar Suchendra M.,Luo Xingzhi,Daniels Richard,Tollner E. William
Subject
Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software
Reference23 articles.
1. CATALOG: A system for detection and rendering of internal log defects using computer tomography;Bhandarkar;J. Machine Vision Appl.,1999
2. Design and prototype development of a computer vision-based lumber production planning system;Bhandarkar;Image Vision Comput.,2002
3. A dual-threshold image sweep-and-mark algorithm for defect detection in veneer;Butler;Forest Products J.,1989
4. An adaptive image processing algorithm for defect defection in douglar-fir veneer;Butler;Forest Products J.,1993
5. A quick defect detection algorithm for magnetic resonance images (MRI) of hardwood logs;Coates;Forest Products J.,1998
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