Reliability of a connected-(r1, s1)-or-(r2, s2)-or-..-or-(rk, sk)-out-of-(m,n): F lattice system-Reference-Cited by-同舟云学术

Reliability of a connected-(r1, s1)-or-(r2, s2)-or-..-or-(rk, sk)-out-of-(m,n): F lattice system

Published:1996-02 Issue:2 Volume:36 Page:151-168
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Yamamoto H.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Consecutive-k-out-of-n:F networks;Bollinger;IEEE Tiw1sactions on Reliability,1982

2. On the consecutive-k-out-of-n:F system;Derman;IEEE Transactions on Reliability,1982

3. Fast solutions for consecutive-k-out-of-n:F system;Hwang;IEEE Transactions on Reliability,1982

4. A swiching-algebraic analysis of consecutive-k-out-of-n:F systems;Rushdi;Microelectronics and Reliability,1987

5. 2-Dimensional consecutive-k-out-of-n:F models;Salvia;IEEE Transactions on Reliability,1990

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