Reliability analysis of repairable and non-repairable systems with common-cause failures-Reference-Cited by-同舟云学术

Reliability analysis of repairable and non-repairable systems with common-cause failures

Published:1989-01 Issue:4 Volume:29 Page:545-547
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Chung Who Kee

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. A study of failure causes based on U.S. power reactor abnormal occurrence reports;Taylor,1975

2. On common-cause failures—bibliography;Dhillon;Microelectron. Reliab.,1979

3. System reliability using binomial failure rate;Chae,1988

4. Common-cause failures in repairable systems;Dhillon,1988

5. A k-of-N:G redundant system with dependent failure rates and common-cause failures;Chung;Microelectron. Reliab.,1988

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3. Common-cause failure analysis of a redundant system with repairable units;International Journal of Systems Science;1994-03

4. Common-cause failure analysis of a redundant system with non-repairable units;Microelectronics Reliability;1993-08

5. A 1-out-of-N: G system with common-cause failures and critical human errors;Microelectronics Reliability;1991-01