LSI reliability prediction based on time-Reference-Cited by-同舟云学术

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LSI reliability prediction based on time

Published:1980-01 Issue:3 Volume:20 Page:351-356
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Jääskeläinen Pentti

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Reliability Prediction of Electronic Equipment,1974

2. G. Kasouf and S. Mercurio, Evaluation of LSI/MSI reliability models. Proc. 1978 Reliab. Maintainab. Symp., pp. 443–446

3. The microprocessor failure rate predictions;Halil;Microelectron. Reliab.,1978

4. MOS integrated circuit reliability;Schnable,1972

5. Reliability report, 2107A/2107B N-channel silicon gate MOS 4k RAMs;Pascoe,1975

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Logarithmic Gamma Distribution - A Useful Tool in Reliability Statistics;Transactions of the Tenth Prague Conference;1988

2. A Method for Predicting VLSI-Device Reliability Using Series Models for Failure Mechanisms;IEEE Transactions on Reliability;1987-06

3. Maturity Factors in Predicting Failure Rate for Linear Integrated Circuits;IEEE Transactions on Reliability;1984-08

4. Reliability prediction of microcircuits;Microelectronics Reliability;1983-01

5. CMOS integrated circuit reliability;Microelectronics Reliability;1981-01

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