Stochastic analysis of standby systems with common-cause failures and human errors-Reference-Cited by-同舟云学术

Stochastic analysis of standby systems with common-cause failures and human errors

Published:1992-12 Issue:12 Volume:32 Page:1699-1712
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dhillon Balbir S.,Yang Nianfu

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. A Study of Failure Causes Based on U.S. Power Reactor Abnormal Occurrence Reports;Taylor;Reliab. Nuclear Power Plants, IAEA-SM-195/16,1975

2. Human Reliability: with Human Factors;Dhillon,1986

3. Mechanical Reliability: Theory, Models and Applications;Dhillon,1988

4. Reliability Analysis of Standby System with Human Errors;Dhillon,1986

5. B.S. Dhillon, N. Yang, “Reliability and Availability Analysis of Warm Standby Systems With Common-Cause Failures and Human Errors,” Microelectronics and Reliability, (to appear).

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