Analysis of one-server two-unit parallel system subject to degradation-Reference-Cited by-同舟云学术

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Analysis of one-server two-unit parallel system subject to degradation

Published:1986-01 Issue:4 Volume:26 Page:657-664
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Gopalan M.N.,Ramesh T.K.,Krishna Kumar K.V.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference1 articles.

1. Analysis of one-server two-unit parallel system;Gopalan;Microelectronics and Reliability,1985

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of a Markov chain system model of a power generating system composed of generating units and transformer units;Life Cycle Reliability and Safety Engineering;2021-03-15

2. Reliability analysis of a two-unit general parallel system with warm standbys;European Journal of Operational Research;2010-03

3. A two-unit general parallel system with (n−2) cold standbys—Analytic and simulation approach;European Journal of Operational Research;2007-01

4. A two-unit parallel system supported by (n− 2) standbys with general and non-identical lifetimes;International Journal of Systems Science;2004-01-15

5. A two-non-identical-unit parallel system with correlated lifetimes;International Journal of Systems Science;1999-01

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