A wafer level reliability method for short-loop processing-Reference-Cited by-同舟云学术

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A wafer level reliability method for short-loop processing

Published:1996-11 Issue:11-12 Volume:36 Page:1859-1862
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Duluc J.B.,Zimmer T.,Milet N.,Dom J.P.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. An approach for relating model parameter variabilities to process fluctuations;Power,1993

2. The use of parametric test data for the prediction of circuit performance;Gueiting,1994

3. Statistical Modeling tools, Methods and application for Integrated Circuit Manufacturability;Iravani,1995

4. Bipolar Semiconductor Devices;Roulston,1990

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Accounting for Autodependent Modes and Evidence;Process Control System Fault Diagnosis: A Bayesian Approach;2016-08-01

2. Bayesian methods for control loop diagnosis in the presence of temporal dependent evidences;Automatica;2011-07

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