Effect of gamma irradiation on the low-frequency (1/̷) noise of linear ics: Reliability physics study-Reference-Cited by-同舟云学术

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Effect of gamma irradiation on the low-frequency (1/̷) noise of linear ics: Reliability physics study

Published:1982-01 Issue:3 Volume:22 Page:353-356
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Khobare S.K.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Noise analysis study of semiconductor devices;Khobare;Microelectron. Reliab.,1979

2. Operational Amplifiers,1971

3. Operational Amplifiers,1971

4. Noise measurement analysis of NPN transistor after gamma irradiation;Khobare;Microelectron. Reliab.,1980

5. Radiation effects on signal and noise;Borrego;IEEE Trans. Nucl. Sci.,1979

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