Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Proc. 5th Annual Conf. on Basic Failure Mechanisms and Reliability in Electronics;Peck,1964
2. Noise Analysis of semiconductor devices;Khobare;Microelectron. Reliab.,1979
3. Origin of 1/f noise in bipolar transistors;Stoisiek;IEEE Trans. Electron Devices,1980
4. Noise analysis and failure mechanisms in electronic components;Stansbury,1964
5. Reliability Physics Notebook;Vaccaro,1965
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