An inspection policy for one-unit system subject to revealed and unrevealed failures-Reference-Cited by-同舟云学术

An inspection policy for one-unit system subject to revealed and unrevealed failures

Published:1981-01 Issue:1 Volume:21 Page:51-62
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Adachi Kouichi,Nishida Toshio

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Optimum checking procedures;Barlow;J. Soc. Indust. Appl. Math.,1963

2. Mathematical theory of reliability;Barlow,1965

3. A problem in equipment maintenance;Weiss;Management Science,1962

4. Inspection policies when duration of checkings is non-negligible;Luss;Operational Research Quarterly,1974

5. The reliability of a system subject to revealed and unrevealed faults;Phillips;Microelectron. Reliab.,1979

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2. Modeling systems with revealing and non-revealing failures undergoing periodic inspection;Communications in Statistics - Simulation and Computation;2022-05-09

3. An inspection policy for unrevealed failures in a two-unit cold standby system subject to correlated failures and repairs;Microelectronics Reliability;1994-07

4. Stochastic analysis of a two-unit system subject to non-negligible inspection time;Reliability Engineering;1984-01

5. Analysis of systems subject to inspection and repair: A state-of-the-art survey;Microelectronics Reliability;1984-01