Noise as a diagnostic and prediction tool in reliability physics-Reference-Cited by-同舟云学术

Noise as a diagnostic and prediction tool in reliability physics

Published:1995-03 Issue:3 Volume:35 Page:455-477
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Jevtić M.M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference114 articles.

1. Reliability physics as a new discipline;Gao;Micrelectron. Reliab.,1988

2. Noise;van der Ziel,1956

3. Fl'uktuacii toka v poluprovodnike (dielektrike) v uslovijah udarnoi ionizacii i lavinnogo proboja;Tager;FTT,1964

4. Multiplication noise in uniform avalanche diodes;McIntyre;IEEE Trans. Electr. Dev.,1966

5. Low-frequency multiplication noise in reference diodes for small multiplication factors;Jevtić;Electron. Lett.,1977

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