Author:
de Munari Ilaria,Fantini Fausto,Conti Paolo
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. HEMT's & HBTs: Devices, Fabrication and Circuits;Ali,1991
2. Failure Mechanisms of GaAs MESFETs and Low-Noise HEMTs;Magistrali,1990
3. Reliability of Discrete MODFETs: Life Testing, Radiation Effects and ESD;Anderson,1988
4. Mechanism of Kink Effect Related to Negative Photoconductivity in AlGaAsGaAs HEMTs;Thomasian;Electr. Lett.,1989
5. Results from Electrical Characterization and Reliability Tests of Commercial AlGaAs/GaAs HEMTs;Magistrali,1990
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献