On the interval reliability of systems modelled by finite semi-Markov processes-Reference-Cited by-同舟云学术

On the interval reliability of systems modelled by finite semi-Markov processes

Published:1994-08 Issue:8 Volume:34 Page:1319-1335
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Csenki A.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference33 articles.

1. Mathematical Theory of Reliability;Barlow,1965

2. Statistical Theory of Reliability and Life Testing;Barlow,1975

3. Interval reliability of spare part stocks;Bazovsky;Quality and Reliability Engineering International,1988

4. Zuverlässigkeit und Instandhaltung;Beichelt,1983

5. Adapting mechanical models to fit electronics;Benz,1990

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