Probability analysis of a 2-out-of-n: F system with common cause failure, multiple failure and dependent failure-Reference-Cited by-同舟云学术

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Probability analysis of a 2-out-of-n: F system with common cause failure, multiple failure and dependent failure

Published:1994-02 Issue:2 Volume:34 Page:289-296
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Harada Koosuke,Hidaka Toshimitsu

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. Dynamic decision elements for 3-unit systems;Tosun;IEEE Trans. Reliability,1977

2. Reliability analysis of a direct parallel connected n+1 redundant power system based on highly reliable DC/DC modules;Thorsell Lars & Lindman Per,1988

3. Reliability of UPS configurations;Muller,1987

4. Approximated reliability of r-out-of-n(F) system with Common Cause Failure and Maintenance;Hidaka;Microelectronics and Reliability,1992

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Availability Analysis of a Redundant System with Common-Cause Failure;Lecture Notes in Electrical Engineering;2013-06-15

2. Reliability Model Based on Hypergraph for Dependent Failure System;Procedia Engineering;2012

3. Common-mode failures in redundant VLSI systems: a survey;IEEE Transactions on Reliability;2000

4. On the transient behaviour of an r-out-of-n:G system;Microelectronics Reliability;1996-03

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