Reliability evaluation of human operators under stress-Reference-Cited by-同舟云学术

Reliability evaluation of human operators under stress

Published:1985-01 Issue:4 Volume:25 Page:729-752
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dhillon Balbir S.,Rayapati Subramanyam N.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. The problem of human-initiated failures;Meister,1962

2. Human Reliability Analysis,1976

3. On Modeling of Human Performance Reliability;Regulinski;IEEE Transactions on Reliability,1973

4. Stochastic Models for Predicting Human Reliability;Dhillon;Microelectronics and Reliability,1982

5. On Human Reliability-Bibliography;Dhillon;Microelectronics and Reliability,1980

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