Fuzzy states as a basis for a theory of fuzzy reliability-Reference-Cited by-同舟云学术

Fuzzy states as a basis for a theory of fuzzy reliability

Published:1993-12 Issue:15 Volume:33 Page:2253-2263
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Cai Kai-Yuan,Wen Chuan-Yuan,Zhang Ming-Lian

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Errors in availability estimation by 2-state models of 3-state systems;Watanabe;Reliab. Engng,1987

2. M. D. Beaudry, Performance related reliability measurement for computing systems, Proc. FTCS 8, 44–49.

3. Fuzzy reliability modeling of gracefully degradable computing systems;Cai;Reliab. Engng Syst. Safety,1991

4. On evaluating the performability of degradable computing systems;Meyer;IEEE Trans. Comput.,1980

5. Survivability Index for CCNs: a measure of fuzzy reliability;Cai;Reliab. Engng Syst. Safety,1991

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