A review of new methods and attitudes in reliability engineering-Reference-Cited by-同舟云学术

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A review of new methods and attitudes in reliability engineering

Published:1973-10 Issue:4 Volume:12 Page:301-IN2
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Blanks H.S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference121 articles.

1. E. O. Codier, Reliability prediction—help or hoax? Proc. 1969 Ann. Symp. Reliab., p. 383.

2. J. Vaccaro, Reliability physics—an assessment. Proc. 1970 Ann. Symp. Reliab., p. 348.

3. Reliability Monitoring of Development Projects;Duane;General Electric Tech. Information Rep. DF62-MD300,1962

4. J. E. Anderson, Correlation of reliability performance measurements. Proc. 1970 Ann. Symp. Reliab., p. 206.

5. E. O. Codier, Reliability growth in real life. Proc. 1968 Ann. Symp. Reliab., p. 458.

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2. A Standard Fit for Neoliberalism;Comparative Studies in Society and History;2012-03-22

3. Statistical Methods in Reliability;Technometrics;1983-11

4. STATISTICAL-METHODS IN RELIABILITY;TECHNOMETRICS;1983

5. Packaging;Semiconducting Devices;1976

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