Author:
Choi Kuey Chung,Nam Kyung Hyun,Park Dong Ho
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference20 articles.
1. The Taguchi Capability Index;Boyles;Journal of Quality Technology,1991
2. A New Measure of Process Capability: Cpm;Chan;Journal of Quality Technology,1988
3. A Graphical Technique for Process Capability;Chan,1988
4. The Robustness of Process Capability Index Cp to Departures from Normality;Chan,1988
5. On the Asymptotic Distributions of Some Process Capability Indices;Chan;Communications in Statistics-Theory and Methods,1990
Cited by
21 articles.
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