Partial and catastrophic failure analysis of a complex system-Reference-Cited by-同舟云学术

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Partial and catastrophic failure analysis of a complex system

Published:1979-01 Issue:4 Volume:19 Page:349-350
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dhillon Balbir S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. A note on a four-state system;Dhillon;Microelectron. Reliab.,1976

2. Mathematical Methods of Reliability;Gnedenko,1969

3. The analysis of the reliability of multistate device networks;Dhillon;Ph.D dissertation,1975

4. Reliability Handbook;Kozlov,1970

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Availability Analysis of Machining System with Common Cause Failure, Inspection and Imperfect Repair;Proceedings of the National Academy of Sciences, India Section A: Physical Sciences;2020-06-04

2. Repairable system with different failure modes;World Congress of Nonlinear Analysts '92;1996-12-31

3. Stochastic behaviour of a three-state complex repairable system with three types of failures;Microelectronics Reliability;1985-01

4. A repairable system with partial and catastrophic failure modes;Microelectronics Reliability;1981-01

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