Formulation of the drift reliability optimization problem-Reference-Cited by-同舟云学术

Formulation of the drift reliability optimization problem

Published:1991-01 Issue:1 Volume:31 Page:159-171
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Styblinski M.A.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Design Centering by Yield Prediction;Antreich;IEEE Trans. Circuits Systems,1982

2. Design of Systems and Circuits for Maximum Reliability or Maximum Production Yield;Becker,1977

3. Sensitivity and Optimization;Brayton,1980

4. Yield Maximization and Worst-Case Design With Arbitrary Statistical Distributions;Brayton;IEEE Trans. Circuits Syst.,1980

5. Selected Papers on Statistical Design of Integrated Circuits,1987

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