Circuit design and parameters in thin-film technology-Reference-Cited by-同舟云学术

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Circuit design and parameters in thin-film technology

Published:1963-01 Issue:1 Volume:2 Page:19-26
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Jenny F.F.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. Final Report, Thin-Film Circuit Functions,1960

2. Final Report, Thin-Film Circuit Fabrication Program,1960

3. Maximum Density Interconnections for Microminiaturized Circuitry;Counihan,1960

4. Final Report, Circuits and Logic for Thin-Film Computer,1961

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterization Method for Integrated Magnetic Devices at Lower Frequencies (up to 110 MHz);Journal of Electronic Testing;2019-03-19

2. Eigenschaften mittels Ionenstrahlzerstäubung hergestellter Widerstände;IFAC Proceedings Volumes;1965-10

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