Cost analysis of a 3-state 2-unit reparable system-Reference-Cited by-同舟云学术

Cost analysis of a 3-state 2-unit reparable system

Published:1984-01 Issue:1 Volume:24 Page:55-59
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Gupta P.P.,Agarwal S.C.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. A reparable 3-state device;Proctor;IEEE Trans. Reliab.,1976

2. Availability of a 2-unit cold-standby system with degraded state;Lesanovsky;IEEE Trans. Reliab.,1982

3. Reliability analysis of 3-state systems;Hatoyama;IEEE Trans. Reliab.,1979

4. A system with two kinds of 3-state elements;Dhillon;IEEE Trans. Reliab.,1980

5. Cost analysis for 2-unit systems;Parthasarathy;IEEE Trans. Reliab.,1979

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