Reliability bounds and other inequalities for discrete life distributions-Reference-Cited by-同舟云学术

Reliability bounds and other inequalities for discrete life distributions

Published:1995-12 Issue:12 Volume:35 Page:1473-1478
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Sengupta Debasis,Chatterjee Anirban,Chakraborty Biman

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Statistical Analysis of Reliability and Life-Testing Models;Bain,1991

2. A discrete time parametric model for the analysis of failure time data;Adams;Aust. J. Statistics,1989

3. Some characterizations of distributions by truncated moments;Gupta;Statistics,1985

4. Hazard functions and life distributions in discrete time;Xekalaki;Communs Statist. Theory Meth.,1983

5. Statistical Theory of Reliability and Life Testing: Probability Models;Barlow,1975

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