A comprehensive review of the lognormal failure distribution with application to LED reliability-Reference-Cited by-同舟云学术

A comprehensive review of the lognormal failure distribution with application to LED reliability

Published:1978-01 Issue:3 Volume:18 Page:267-279
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Jordan A.S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. The reliability of semiconductor devices in the Bell System;Peck,1974

2. R. H. Saul, E. H. Nicollian, and D. A. Harrison, unpublished results.

3. High stress aging to failure of semiconductor devices;Dodson,1961

4. Thermally accelerated aging of semiconductor components;Reynolds,1974

5. The Lognormal Distribution;Aitchison,1957

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