Stochastic models for evaluating probability of system failure due to human error-Reference-Cited by-同舟云学术

Stochastic models for evaluating probability of system failure due to human error

Published:1984-01 Issue:5 Volume:24 Page:921-924
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dhillon Balbir S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. On human Reliability—bibliography;Dhillon;Microelectron. Reliab.,1980

2. Human factors in reliability;Meister,1966

3. Human reliability analysis;Hagen,1976

4. The problem of human-initiated;Meister,1962

5. Stochastic models for predicting human reliability;Dhillon;Microelectron. Reliab.,1982

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