Built-in self-test and diagnostic support for safety critical microsystems-Reference-Cited by-同舟云学术

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Built-in self-test and diagnostic support for safety critical microsystems

Published:1996-07 Issue:7-8 Volume:36 Page:1125-1136
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Olbrich T.,Richardson A.M.D.,Bradley D.A.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference30 articles.

1. A Standard Interface for Self-Validating Sensors;Henry,1991

2. Smart Sensors get tough;Ormond;Electronics Weekly,1993

3. Integrated smart sensors;Huijsing;Sensors and Actuators A,1992

4. Application of the Silicon Technology for Microsystems in the Medical Techniques;Mokwa,1991

5. G. Tschulena “Micromechanics Business Opportunities”, Micro System Technologies 92, 3rd Int. Conference, Berlin, 21–23.10.92, pp.51–57.

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1. Dry Test Methods for Micropumps;Applied Sciences;2022-11-30

2. Transient Response Testing (TRT) of Intelligent Sensors Interface in Switched Current Technology;2007 Second International Conference on Bio-Inspired Computing: Theories and Applications;2007-09

3. Interface circuit for resistive sensors utilizing digital potentiometers;Sensors and Actuators A: Physical;2007-07

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