Reliability analysis of k-out-of-n systems with partially repairable multi-state components-Reference-Cited by-同舟云学术

Reliability analysis of k-out-of-n systems with partially repairable multi-state components

Published:1996-10 Issue:10 Volume:36 Page:1407-1415
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Pham Hoang,Suprasad A.,Misra R.B.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Reliability in Engineering Design;Kapur,1985

2. On the Optimal Design of k-out-of-n:G Subsystems;Pham;IEEE Transactions on Reliability,1992

3. On The Evaluation of the Reliability of k-out-of-n Systems;Risse;IEEE Transactions on Reliability,1987

4. Computing k-out-of-n System Reliability;Barlow;IEEE Transactions on Reliability,1984

5. The Efficiency of Computing the Reliability of kout-of-n Systems;Pham;IEEE Transactions on Reliability,1988

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