A chaos based revitalization of large reliability knowledge bases-Reference-Cited by-同舟云学术

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A chaos based revitalization of large reliability knowledge bases

Published:1993-01 Issue:2 Volume:33 Page:259-265
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dohnal M.,Kvapilik M.,Dohnalova J.,Vykydal J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. M. Dohnal, Revitalization of Primary Reliability Knowledge, Microelectronics and Reliability, in print

2. M. Dohnal, Reliability Knowledge and Fractal Evaluation of Chaos, Microelectronics and Reliability, in print

3. A survey of knowledge acquisition techniques and tools;Boose;Knowledge Acquisition,1989

4. Cognitive science;Nowakowska,1986

5. M. Dohnal, A Quality Evaluation of Fuzzy Reliability Bases in Mechanical Engineering, Quality and Reliability Engineering International, submitted

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Qualitative identification of chaotic systems behaviours;Chaos, Solitons & Fractals;2008-10

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