Author:
Schnable George L.,Swartz George A.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference101 articles.
1. Modes of Failure of MOS Devices;Eccleston;Microelectron. Reliab.,1971
2. Failure Modes and Reliability of Dynamic RAMs;Barrett,1976
3. Reliability of CMOS Integrated Circuits;Schnable;Computer,1978
4. Techniques of Evaluating Long Term Oxide Reliability at Wafer Level;Crook,1978
5. The Semiconductor Memory Book;Intel Marketing Communications,1978
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献