Reliability analysis of a two state repairable parallel redundant system under human failure-Reference-Cited by-同舟云学术

Reliability analysis of a two state repairable parallel redundant system under human failure

Published:1986-01 Issue:2 Volume:26 Page:221-224
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Gupta P.P.,Kumar Sharma Rakesh

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Reliability evaluation of the human component in man-machine systems;Williams;Electl Mfg,1958

2. The problem of human-initiated failures;Meister,1962

3. Availability of a two-unit cold standby system with degraded state;Lesanovsky;IEEE Trans. Reliab.,1982

4. Reliability analysis of three-state systems;Hatoyama;IEEE Trans. Reliab.,1979

5. A system with two kinds of three-state elements;Dhillon;IEEE Trans. Reliab.,1980

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