N-unit parallel redundant system with multiple correlated failures-Reference-Cited by-同舟云学术

N-unit parallel redundant system with multiple correlated failures

Published:1986-01 Issue:1 Volume:26 Page:31-34
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Nikolov Angel Vasilev

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. N-unit parallel redundant system with correlated failures and single repair facility;Itoi;Microelectron. Reliab.,1978

2. Reliability and maintainability of a multicomponent series-parallel system under several repair disciplines;Kodama;Microelectron. Reliab.,1982

3. k-out-of-N redundant system with common cause failures;Who Kee Chung;IEEE Trans. Reliab.,1980

4. Multi-microprocessors: an overview and working example;Fuller,1978

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