A note on “A finite range distribution of failure times”-Reference-Cited by-同舟云学术

A note on “A finite range distribution of failure times”

Published:1986-01 Issue:1 Volume:26 Page:183-189
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Lai C.D.,Mukherjee S.P.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Statistical Theory of Reliability and Life Testing;Barlow,1981

2. Some Criteria for aging;Bryson;Journal of American Statistical Association,1969

3. Eine Charakterisierung der Exponentialverteilungen;Bosch;Z. Agnew. Math. Mech.,1977

4. The HNBUE and HNWUE classes of life distributions;Klefsjö;Naval Research Logistics Quarterly,1982

5. Exact moments of order statistics for a power-function population;Malik;Skandinavisk Aktuarietidskrift,1967

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