Nickel-chromium resistor failure modes and their identification-Reference-Cited by-同舟云学术

Nickel-chromium resistor failure modes and their identification

Published:1973-04 Issue:2 Volume:12 Page:125-138
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Keenan W.F.,Runyan W.R.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. Observations on the Reliability of Thin-Film Nickel-Chromium Resistors;Philofsky,1970

2. PREFERRED ORIENTATION IN BIAS‐SPUTTERED NICKEL CHROMIUM FILMS

3. J. J. Bohrer and C. W. Lewis. The aging mechanism of metal film resistors. Physics of Failure in Electronics, Vol. 2, p. 338.

4. D. W. Levinson and R. G. Phol, Failure physics: an essential discipline for reliability physics engineers. Physics of Failure in Electronics, Vol. 1.

5. Some applications of triode sputtering to integrated circuits

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