Improving the lower bound for the reliability when the strength distribution is gamma and the stress distribution is chi-square-Reference-Cited by-同舟云学术

Improving the lower bound for the reliability when the strength distribution is gamma and the stress distribution is chi-square

Published:1988-01 Issue:1 Volume:28 Page:27-41
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Jaisingh Lloyd R.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. Reliability in Engineering Design;Kapur,1977

2. The Determination of the Probability of Failure by Stress/Strength Interference Theory;Disney,1968

3. A Method of Relating Factor of Safety and Reliability;Mischke;Journal of Engineering for Industry,1970

4. On the Relation Between the Factor of Safety and REliability;Dao-Thien;Journal of Engineering for Industry,1974

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