A research study of environmental factors for the gamma distribution-Reference-Cited by-同舟云学术

A research study of environmental factors for the gamma distribution

Published:1992-03 Issue:3 Volume:32 Page:331-335
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Wang Hong-Zhou,Ma Bao-Hua,Shi Ju-Sheng

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference9 articles.

1. Hong-zhou Wang and Bao-hua Ma, Bayesian estimation of environmental factors for the binomial distribution, IEEE Trans. Reliab. (submitted for publication).

2. Reliability Assessment;Zhou,1990

3. ADB001039, Method for developing equipment failure rate K factors.

4. Statistical Models and Methods of Life Data;Lawless,1982

5. Maximum likelihood estimation of the parameters of the gamma distribution and their bias;Choi;Technometrics,1969

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