Characterization of guest molecules adsorbed on zeolites of known structure by combined x-ray powder profile refinements and conventional difference-fourier techniques. Part II - Localization of the n-hexane, TPA and p-xylene guests in a pentasil type zeolite-Reference-Cited by-同舟云学术

Characterization of guest molecules adsorbed on zeolites of known structure by combined x-ray powder profile refinements and conventional difference-fourier techniques. Part II - Localization of the n-hexane, TPA and p-xylene guests in a pentasil type zeolite

Published:1987-04 Issue:4 Volume:22 Page:489-496
ISSN:0025-5408
Container-title:Materials Research Bulletin
language:en
Short-container-title:Materials Research Bulletin

Author:

Mentzen B.F.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference14 articles.

1. B.F. MENTZEN, Mat. Res. Bull., Part I, in press.

2. A new computer program for Rietveld analysis of X-ray powder diffraction patterns

3. B.F. MENTZEN and F. VIGNÉ-MAEDER, Mat. Res. Bull., in press.

4. ZSM-5-type materials. Factors affecting crystal symmetry

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