In Situ Studies of Crystalline Semiconductor Surfaces by Reflectance Anisotropy
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Elsevier
Reference87 articles.
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1. Stress-induced optical anisotropies measured by modulated reflectance;Semiconductor Science and Technology;2004-07-31
2. Simultaneous determination of bulk isotropic and surface-induced anisotropic complex dielectric functions of semiconductors from high speed Mueller matrix ellipsometry;Thin Solid Films;2004-05
3. Multichannel Mueller Matrix Ellipsometry for Simultaneous Real-Time Measurement of Bulk Isotropic and Surface Anisotropic Complex Dielectric Functions of Semiconductors;Physical Review Letters;2003-05-28
4. Reflection;Optical Diagnostics for Thin Film Processing;1996
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