X-Ray Diffraction Analysis of Diffusion in Thin Films-Reference-Cited by-同舟云学术

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X-Ray Diffraction Analysis of Diffusion in Thin Films

Published:1988 Issue: Volume: Page:201-248
ISSN:0161-9160
Container-title:Treatise on Materials Science & Technology
language:
Short-container-title:

Author:

MURAKAMI MASANORI,SEGMÜLLER ARMIN,TU KING-NING

Publisher

Elsevier

Reference64 articles.

1. Bales, T. T. (1965). M.S. Thesis, Virginia Polytechnic Institute and State University, Blacksburg, Va.

2. On spinodal decomposition

3. On spinodal decomposition in cubic crystals

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. In situ studies of diffusion and crystal growth in plasma deposited thin ITO films;Thin Solid Films;2000-12

2. A Non-Destructive Technique to Measure the Extent of Inter-Diffusion in Oxide Solid Solution Interfaces Between Metals and Ceramics;MRS Proceedings;1989

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